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Ion Beam Analysis: Fundamentals and Applications

by Michael Nastasi,James W. Mayer,Yongqiang Wang

ISBN 13: 9781439846384

Format: Illustrated (472 pages)
Publisher: CRC Press
Published: 15 Aug 2014

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Radiation Damage in Materials: Helium Effects

by Yongqiang Wang,Khalid Hattar

ISBN 13: 9783039363629

Format: Hardcover (196 pages)
Publisher: MDPI AG
Published: 11 Aug 2020

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